50 mm Ball Accessibility Probe with Handle
Specification:
IP1X Probe A / test probe A
1, According to: IEC 61032:1997 / IEC 60529:2001 and UL etc.
2, IP1X Probe A (Test Probe A) is necessary appliance for household and similar electrical appliance of against electric shock protection test.
1. Ball Diameter: 50 mm
2. Total Length: 210 mm
3. Baffle Plate Diameter: 45 mm
4. Baffle Plate Thickness: 4 mm
5. Handle Diameter: 45 mm
6. Handle Length: 95 mm
7. According to IEC 61032 figure 1 (the Test probe A), table 6 the first characteristics (1).
Application:
HK LEE HING INDUSTRY CO., LIMITED are specialized in manufacturing special, custom built, test and measuring equipment for products testing as per international norms and offering calibration services and related information. Our products and services are used by research & development establishments, test laboratories, defense establishments, government institutions & manufacturing industries to fulfill the clients' requirements.
Main Products: go no go gauges, IP Tester, Test Probe Kit, Impact Test Equipment, Test Probes, Spring Hammer, IEC 61032 Test Finger, AC Hipot Tester, IEC Test Probe, UL Test Probe, Material Flammability Tester, IP Code Tester, Impact Test Apparatus, Plugs and Socket Outlet Gauge, Security Testing Machine, Lamp Cap Gauge Tester, Lampholders Gauge Tester, Plug & Socket Tester, Electrical Safety Tester, LED Test Instruments, Environmental Test Equipment, Instrument Accessories, Weighing Sensor and More.
If you require equipment to test products such as home appliances, electrical accessories like switches, sockets, connectors, etc. industrial & road lighting luminaires, automobile lighting systems or related categories, we can provide the solutions you need.
We would appreciate your comments on the layout design, presentation or other aspects of our website.
Website: http://www.iec-test.com
Contacts: Nina She
E-mail: sales@china-gauges.com
TEL: +86-755-33168386
FAX: +86-755-61605199
Phone: +86-15919975191
SKYPE: nina.she@outlook.com
Address: 1F Junfeng Building, Gongle, Xixiang, Baoan District, Shenzhen, Guangdong, China
ZIP: 518102
Website: http://www.iec-test.com/